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Functional test simulates the operating environment for the product under test thereby minimizing the expensive cost for the customer to provide the actual testing equipment
It eliminates the need for expensive system tests in some cases, which saves the OEM lots of time and financial resources.
It can check the functionality of the product anywhere from 50% to 100% of the product being shipped thereby minimizing the time and effort on the OEM to check and debug it.
Prudent testing engineers can extract the most productivity out of functional test thereby making it the most effective tool short of system test.
Functional test enhances the other types of tests such as ICT and flying probe test, making the product more robust and error free.
Although a costly fixture is required, ICT covers 100% testing so that all power and ground shorts are detected.
ICT testing does power up testing and eliminates customer debug needs to almost ZERO.
ICT does not take a very long time to perform, for example if flying probe takes 20 minutes or so, ICT for the same time might take a minute or so.
Checks and detects shorts, opens, missing components, wrong value components, wrong polarities, defective components and current leakages in the circuitry.
Highly reliable and comprehensive test catching all manufacturing defects, design faults, and flaws.
Testing platform is available in Windows as well as UNIX, thus making it slightly universal for most testing needs.
Test development interface and operating environment is based on standards for an open system with fast integration into an OEM customer’s existing processes.
ICT is the most tedious, cumbersome, and expensive type of testing. However, ICT is ideal for mature products requiring volume production. It runs the power signal to check voltage levels and resistance measurements at different nodes of the board. ICT is excellent at detecting parametric failures, design related faults and component failures.